This
book introduces readers to various radiation soft-error mechanisms such as soft
delays, radiation induced clock jitter and pulses, and single event (SE)
coupling induced effects. In addition to discussing various radiation hardening
techniques for combinational logic, the author also describes new mitigation
strategies targeting commercial designs. Coverage includes novel soft error
mitigation techniques such as the Dynamic Threshold Technique and Soft Error
Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE
crosstalk noise, delay and speed-up effects. Various mitigation strategies to
eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low
power energy-efficient designs and the impact of leakage power consumption
optimizations on soft error robustness. The author presents an analysis of various power optimization techniques,
enabling readers to make design choices that reduce static power consumption
and improve soft error reliability at the same time.
book introduces readers to various radiation soft-error mechanisms such as soft
delays, radiation induced clock jitter and pulses, and single event (SE)
coupling induced effects. In addition to discussing various radiation hardening
techniques for combinational logic, the author also describes new mitigation
strategies targeting commercial designs. Coverage includes novel soft error
mitigation techniques such as the Dynamic Threshold Technique and Soft Error
Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE
crosstalk noise, delay and speed-up effects. Various mitigation strategies to
eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low
power energy-efficient designs and the impact of leakage power consumption
optimizations on soft error robustness. The author presents an analysis of various power optimization techniques,
enabling readers to make design choices that reduce static power consumption
and improve soft error reliability at the same time.
